CMS Muon Endcap CSC AFEB Mass Production Test
(Status of the test and results of data analysis).

blue_ball.gif Introduction.

The 16 channel preamplifier-shaper-discriminator anode front end boards AFEB AD16 (Ref. 1) provide accurate timing of the input signals coming from the groups of anode wires of the CMS muon endcap CSC chambers. The status and results of the mass production test of these boards is presented (see also Ref. 2). The descriptions of the figures in Table 1,1a are: for the threshold, noise etc - Fig.1-3, for the resolution time - Fig.4, for the propagation and the slewing time - Fig.5. The red lines in Fig. 1-5 are the certification cuts.The number of the boards passed the certification cuts in the latest set of runs is given in Table 2 along with the list of used cuts. There are also list and graph of failure reasons in the last column of Table 2.
blue_ball.gif Table 1. Results of the test vs ascending run number (all boards).

Date Runs ## # of boards Threshold, Noise etc Resolution time Propagation and slewing time
9/4/2001 - 11/08/2002 1000021-1604 12184 Fig. 1, Fig. 2, Fig. 3 Fig. 4 Fig. 5

blue_ball.gif Table 1a. Results of the test vs ascending run number (certified boards).

Date Runs ## # of boards Yield, % Threshold, Noise etc Resolution time Propagation and slewing time
9/4/2001 - 11/08/2002 1000021-1604 12141 99.6 % Fig. 1, Fig. 2, Fig. 3 Fig. 4 Fig. 5

blue_ball.gif Table 1b. Results of the test vs ascending run number (certified boards, CERN, June 2009).

Date Runs ## # of boards Yield, % Threshold, Noise etc Resolution time Propagation and slewing time
June 2009 1002161-2237 146 97.3% Fig. 1, Fig. 2, Fig. 3 Fig. 4 Fig. 5

blue_ball.gif The uniformity of the channels within each certified board.

The channel uniformity is shown using the channel residual which is defined as the difference between the channel parameter and its value averaged over the 16 channels of each board, see it in ( Linear ) and ( Logarithm ) scales.
blue_ball.gif Table 2. Status of the test (rate) and the latest set of runs.

N Date Runs ## # of boards in # of boards passed the cuts Yield, % Cuts list # Failure reasons
27 11/8/2002 - 11/8/2002 1001587-1604 166 134 81 % Cuts # 7 List Fig


blue_ball.gif Test stability.

We are monitoring the test stability using 10 monitoring boards measured at the end of the each test day. Table 3 below presents figures with 10 pages each corresponding to the boards measured in slots 1-10 of the test adapter board. The changes of average parameters relatively to their values in the first measurements are plotted. Table 3a presents stability channel by channel for all 10 slots.
Table 3. Results of the monitoring boards test vs ascending run number (for average parameters).

Date Runs ## Thresh. and Noise Gain and Offset Thresh. and Noise (Cint) Cint and Max. Thresh. Resol. time Prop. and Slew. time
9/4/2001-11/08/2002 1000021-1604 Fig.1 Fig.2 Fig.3 Fig.4 Fig.5 Fig.6


Table 3a. Results of the monitoring boards test vs ascending run number (for channel by channel parameters ).

Date Runs ## Thresh. and Noise Gain and Offset Thresh. and Noise (Cint) Cint and Max. Thresh. Resol. time Prop. and Slew. time
9/4/2001-11/8/2002 1000021-1604 Fig.1 Fig.2 Fig.3 Fig.4 Fig.5 Fig.6, Fig.7



blue_ball.gif A 16-channel ASIC CMP16G chip test.

Table 4 and 5 present summary on the CMP16G chips.
Table 4.

Date # of tested chips # of good chips Yield
09/25/2001 - 04/03/2003 31168 28643 92 %

Table 5. Status as of Nov. 14, 2006.

Location # of chips
Installed on AFEBs 12184
Used for replacement on AFEBs 165
Stored at CMU 11394
Stored at Fermilab 90
Sent to JINR, Dubna 2656
Sent to PNPI, Gatchina 66
Sent to TOTEM, CMS 66
Sent to CERN, by 03/2004 726
Sent to TRIUMF, by 09/2004 108
Sent to Germany, by 02/2005 1056
Sent to CERN, 08/2006 132
TOTAL 28643

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Last modified: Thu July 30 12:50:00 PM CST 2009