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Talk - Talk transparencies

Proposal - "Testing analog part of ALCT on CSC at UF", Oct. 31, 2002.

List of figures.

Fig.1 - ADC calibration for ALCT672, U vs ADC code and nonlinearity (example)

Fig.2 - ADC calibration for ALCT672, offsets and slopes in U vs ADC code.

Fig.3 - DAC calibration for ALCT672, U vs DAC code and nonlinearity (example)

Fig.4 - DAC calibration for ALCT672, offsets and slopes in U vs DAC code.

Fig.5 - a scope trace of the test pulse and its fit for AFEB in location 19 at DAC=25, ALCT384

Fig.6 - the scope traces of the test pulses and fits for AFEBs in locations 1,4,7... 22 at DAC=25, ALCT384

Fig.7a - AFEB input test pulse max. amplitude at DAC=25, ALCT288

Fig.7b - AFEB input test pulse max. amplitude at DAC=25, ALCT384

Fig.7c - AFEB input test pulse max. amplitude at DAC=25, ALCT672

Fig.7d - AFEB input test pulse max. amplitude vs DAC, ALCT384 #120 on ME234/2 #85 at UCLA FAST site. Calibration 18+4.6*DAC is used by UCLA FAST site.

Fig.8a - offsets and slopes in max. test amplitude vs DAC code, ALCT288

Fig.8b - offsets and slopes in max. test amplitude vs DAC code, ALCT384

Fig.8c - offsets and slopes in max. test amplitude vs DAC code, ALCT672

Fig.9a-b - the scope traces of the test pulses and fits (page 1), max.amplitudes (page 2) for six test cathode strips at DAC=25, ALCT384

Fig.10a - comparison of nominal thresholds of 20 fC obtained at UF FAST site and corrected for Cint with those from AFEB test stand, ALCT672 on ME2/1

Fig.10b - comparison of nominal thresholds of 20 fC obtained at UF FAST site and corrected for Cint with those from AFEB test stand, ALCT384 on ME234/2

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Last modified: Mon Jan 20 14:30:00 CST 2003