Anode Front-end Electronics current status
(presented by N.Bondar, PNPI)
EMU meeting at Fermilab, Nov. 18,20 1999
Our goals were:
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1. Prepare everything for integration 16 channel Anode Front End
Board (AFEB) with the chamber and ALCT.
Problems to study:
- Pick up noise, Channel to channel cross talk, grounding and
shielding issues
- Connection with ALCT and digital noise cross talk
- Cathode board to AFEB cross talk
- Power supply cross talk
- Test pulsing
Hardware problems:
- AFEB fixation
- AFEB grounding solution
- AFEB shielding solution
- Signal cable solution
- Power supply solution
2. Further studying the CMP16-C and CMP8 chip,
preparation for the "pilot submission".
What was done:
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1. Integration.
AFEB behavior on the chamber was studied.
Simple model for pickup noise and additional cross talk was
proposed (App.1). According this model we find the best layout for
cabling and grounding. We have estimated "the ground noise
current" on the chamber - this value is about 50uA under normal
condition when everything is quiet - "quiet" condition.
There is a comparison for "good" and "poor" ground
solution on Fig.1 and Fig.2 for "quiet" chamber conditions.
On Fig.3 and Fig.4 there is a "good" ground effect for cross
talk between 4 wire groups in one chip (channel 1- 16) under the
test pulse conditions. The second chip (channels 65 - 80) was let
without changes for comparison.
Cross talk Cathode to Anode electronics when cathode
electronics works in the test mode after all modifications was
pretty small (extra noise less that noise on Fig.2).
Cross talk from Power supply after Phil's modifications
became compatible with the noise on Fig.2.
Cross talk ALCT to AFEB is not studied yet. But most
measures are proposed.
Test pulsing problems is under investigations. Currently we
follow "two test options" way. It implies that ALCT board will
have two possibilities to send a test pulse to the chip input and to
the test strip.
We know how to connect AFEB to chamber and "good"
ground "in principle" but technical solution for each topic is in
progress.
2. Chips study.
The main problem we have hit in CERN was pretty big cross
talk. There was a big problem find the reason for this cross talk.
The cross talk in chip CMP8 and in chip CMP16 was measured
and it value was less than 0.5% inside chip. The most cross talk we
can receive from a "poor" ground, long input cable and other
parasitic channel to channel capacitance inside and out the
chamber. This problem is still under investigation.
3. Electronics production and planning.
The new AD16 board was designed and sent for production.
We hope to receive the "September" submission chips in the
beginning of December and test them.
We hope to receive 8 channel delay chip after November 25.
After that we have about 10 days for testing this chip.
We have settled the most questions with this chip performance:
Slow control interface, signal levels, pin assignment, signal
levels, and other details. Sent request to company to find proper
packaging.
But we have one very bad news - AMI cancelled 1.2u
technology and opened 1.5u technology (they assume that this
technology stable and more reliable analog BiCMOS technology).
I recognized this news very recently and did not understand yet the
scale of this "disaster", but we need redesign all our chips for this
new technology. This problem is under investigations. In the worst
case we can slip for two-three months with the pilot submission
from our "optimistic" schedule.
So according current understanding the pilot submission may be in
the beginning of April for CMP16 chip.
As to Delay chip the situation is more stable - if we find
correct package for this chip just now, we will be about in our
previous schedule. We will submit this chip in January and get
back in the beginning of April. And if everything be all right we
can make a pilot submission for this chip also in April.
bondar@fnal.gov (HTML version - teren@fnal.gov)
Last modified: Nov 29 12:00:00 CST 1999